NCSLI Technical Program Chair, 2016
NCSL International Technical Program Committee
WELCOME MEASUREMENT SCIENCE PROFESSIONALS
The NCSLI Technical Program Committee welcomes papers from practitioners and researchers in the field of metrology including: Engineers, metrologists, scientists, technicians, young professionals, old professionals, laboratory managers, quality managers, statisticians, lab assessors, technical writers and all measurement science professionals. Metrology related topics, include: Primary and secondary measurement standards, measurement techniques, international comparisons, metrological traceability, uncertainty and statistical analysis, laboratory accreditation and management, and new advances in measurement science. Numerous type of measurements including: chemical, dimensional, electrical, flow, force, humidity, mass, materials, optical, pressure, temperature, time and frequency, voltage and vacuum.