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Workshop & Symposium
August 13 - 17, 2017
Gaylord National Convention Center
National Harbor, Maryland

Tutorial Program
Sunday August 13 and Monday August 14
Exhibition Hall

Monday August 14 - Thursday August 17
Technical Program
Tuesday 15 - Thursday 17

DISCOUNTS OFFERED TO PRESENTERS - Thank you for your participation!

All speakers who upload their abstract by the December 21, 2016 deadline (and are accepted) will receive a $150 discount off of registration.
All speakers who upload their manuscript by the April 17, 2017 deadline will receive a $350 discount off of registration. Total possible discount offered is $500.

A "Best Paper" award will be presented in each track. The overall best Conference paper will then be awarded to the paper with the highest point total. In order for a paper to be considered for the Best Paper Award, all deadlines must be met.

Online Registration

Tutorial Registration Form

Tutorial Instructor Registration Form

Guest Registration Form

Conference PowerPoint for Presentations
(Microsoft PowerPoint Presentation)
Abstract Instructions
(Adobe PDF File)
Manuscript Instructions
(Adobe PDF File)
Poster Instructions
(Adobe PDF File)
Writing Learning Objectives
(Adobe PDF File)
Duplicate Publication Policy
(Microsoft Word Document)
Style Guide
(Adobe PDF File)

NCSLI Technical Program Chair, 2016
Carol Hockert

NCSL International Technical Program Committee

The NCSLI  Technical Program Committee welcomes papers from practitioners and researchers in the field of metrology including: Engineers, metrologists, scientists, techniciansyoung professionals, old professionals,  laboratory managers, quality managers, statisticians, lab assessors, technical writers and all measurement science professionals.  Metrology related topics, include: Primary and secondary measurement standards, measurement techniques, international comparisons, metrological traceability, uncertainty and statistical analysis, laboratory accreditation and management, and new advances in measurement science.  Numerous type of measurements including:  chemical, dimensional, electrical, flow, force, humidity, mass, materials, optical, pressure, temperature, time and frequency, voltage and vacuum.  

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